div>Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging.
End‑User Support & Incident Resolution
Serve as a primary escalation point for Level 2/3 desktop support, delivering in‑person, remote, and hybrid support to global end‑users.