Develop Reliability Test-Screens: Ensuring REL screens for all released EFK and BK8 LV-MV products are developed and released following our best practices. Device Characterization: Manage wafer-level REL screens, used by all of our technologies.
Numbers & Facts
Location
Fishkill, NY
Description
Develop Reliability Test-Screens:
Ensuring REL screens for all released EFK and BK8 LV-MV products are developed and released following our best practices.
Up-keep of documenting our Reliability best practies.
Development of improved REL screen test-methods.
Development of more efficient testing, for reduced test-time, without sacrificing quality.
Device Characterization:
Manage wafer-level REL screens, used by all of our technologies. Standardize and improve, as predictors for TDDB, HTRB, HTGB, HAST. Speed up development.
Develop additional WL REL predictor methods.
Support Wafer-Level-UIS testing.
Provide standard WL device characterization.
Leverage EFK TDDB capabilities.
Lot-data analysis, with focus on yield, yield learning.