Test Development Engineer, Technology Development

ON Semiconductor

  • Fishkill, NY
  • 28 days ago

    Highlights

    Develop Reliability Test-Screens: Ensuring REL screens for all released EFK and BK8 LV-MV products are developed and released following our best practices. Device Characterization: Manage wafer-level REL screens, used by all of our technologies.

    Numbers & Facts

    LocationFishkill, NY

    Description

    Develop Reliability Test-Screens:

    • Ensuring REL screens for all released EFK and BK8 LV-MV products are developed and released following our best practices.
    • Up-keep of documenting our Reliability best practies.
    • Development of improved REL screen test-methods.
    • Development of more efficient testing, for reduced test-time, without sacrificing quality.

    Device Characterization:

    • Manage wafer-level REL screens, used by all of our technologies. Standardize and improve, as predictors for TDDB, HTRB, HTGB, HAST. Speed up development.
    • Develop additional WL REL predictor methods.
    • Support Wafer-Level-UIS testing.
    • Provide standard WL device characterization.
    • Leverage EFK TDDB capabilities.
    • Lot-data analysis, with focus on yield, yield learning.
    • Coordinate with other REL support groups.
    • Learn TD
    • Begin study for certification as a REL Engineer.

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