Qualifications: Preferred Skills and Qualifications: • Strong skills in sample preparation, careful sample handling, and safe chemical handling. • Experience preparing and handling whole wafers, diced wafer pieces, thin films, and other materials commonly encountered in semiconductors or advanced materials applications. • Experience with analytical instrumentation in a chemical, materials, or surface analysis laboratory setting. • Familiarity with high-vacuum instrumentation, mass spectrometry, surface analysis, spectroscopy, microscopy, or related techniques is preferred. • Ability to document analytical results and prepare clear, concise technical reports. • Demonstrated commitment to laboratory safety and responsible adherence to all safety protocols. Good attention to detail and ability to follow established procedures consistently. • Ability to work effectively in a team environment under tight timelines and competing priorities. • Strong communication skills and willingness to coordinate closely with scientists and project stakeholders. Minimum Qualifications: • Bachelor of Science (B.S.) in chemistry, materials science, physics, engineering, or a related field, or equivalent knowledge acquired through on-the-job training.
Responsibilities: Job Description: The candidate will assume responsibility for the second-shift operation of a Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) instrument in support of the Qnity Leveraged Analytical Sciences group. This in-person position is located at the Experimental Station in Wilmington, DE. The candidate will work under the direction of experienced scientists to provide analytical support for Research and Development (R&D), Technical Service and Development (TS&D), and Manufacturing. Key job responsibilities include: • Prepare samples for ToF-SIMS analysis following established procedures, including sample mounting, handling of semiconductor wafers, powders, films, coatings, and other materials, and preparation of air- or contamination-sensitive samples when needed. • Perform routine ToF-SIMS analyses, including surface spectroscopy, chemical imaging, and depth profiling using established analytical methods. • Operate the ToF-SIMS instrument during second-shift hours, including sample loading, vacuum system operation, beam tuning, data acquisition, and basic instrument checks. • Support routine instrument maintenance and housekeeping activities following established procedures. Coordinate service or troubleshooting needs with first-shift operators and scientists. • Document experimental conditions, sample information, observations, and analysis results in appropriate laboratory systems. • Prepare analysis summaries and contribute to technical reports, including discussion of results, observations, and potential analytical findings. • Dispose of laboratory waste according to established protocols. • Work second-shift hours and coordinate work with first-shift scientists to ensure continuity of lab operations. Length of assignment: Annual Renewal Shift Details: • Work hours/days: 40 hours/week • M-F ~4:00 pm – 12:30 am (some flexibility may be available in daily start/finish times) • Candidate will be trained during daytime hours (~8:30 am – 5 pm) for the first three months.