Work with Test Engineering team during Silicon bring-up and creating flow/scripts necessary for debugging/diagnosing compression LPC ATPG patterns (stuck-at/at speed), MBIST patterns on ATE for development and production programs. Top level and hard macro block level scan insertion with high EDT compression ratio (Hybrid LBIST, EDT IP/ATPG, LPCT EDT, AC scan verification with high speed PLL, MBIST, and IJTAG).