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Rigaku Semiconductor Metrology Division is seeking an Applications Scientist to provide on-site customer applications support for our advanced x-ray metrology products, with a primary focus on T-SAXS/GI-SAXS. This role centers on developing high-performance measurement recipes, improving repeatability and sensitivity, and advancing data analysis and fitting methodologies to address complex customer challenges. The position works closely with Rigaku service, design, and development groups-both locally and in Japan-to ensure successful deployment and continuous improvement of TSAXS applications.
Responsibilities:
- Serve as the primary on‑site T-SAXS technical contact for a key customer account, responding quickly to support needs and new measurement requirements.
- Implement advanced fitting approaches for challenging semiconductor structures, including memory and advanced logic.
- Translate customer process requirements into robust, production‑ready recipes that deliver consistent, high‑confidence results.
- Develop robust measurement workflows that ensure repeatability, sensitivity, and stability across varying process conditions.
- Provide local, hands‑on support for T-SAXS metrology tools, including installation support, tool start‑up, calibration, and routine operational checks.
- Diagnose and resolve measurement, modeling, and data‑quality issues in collaboration with customer and Rigaku engineering teams.
- Monitor tool performance, identify trends, and recommend corrective actions to maintain tool stability and uptime.
- Assist customers with recipe development, tool operation, and data analysis, both remotely and on‑site.
- Write technical documentation and application notes, and create and maintain training material. Clearly and effectively communicate highly technical subject matter to a variety of audiences.
- Some travel to customer sites located primarily within the United States, but with occasional international trips.
Qualifications:
- Ph.D or M.S. in Material Science, Physics, Chemistry, Solid State, or related engineering fields.
- Minimum of three years of work experience as an applications scientist or applications engineer in a semiconductor metrology tool manufacturer or as a process engineer in a semiconductor device manufacturer with thin film quality control/metrology experience.
- Hands‑on experience with X‑ray analytical techniques (T-SAXS, GI-SAXS, XRD, XRR, XRF, or related) or optical methods (OCD).
- Experience with model-based fitting approaches to analyze complex datasets.
- Strong understanding of fundamentals of X-ray physics, spectroscopy, diffraction and scattering.
- Strong understanding of semiconductor device manufacturing process.
- Excellent analytical thinking and problem-solving skills, e.g. root cause analysis, 5 Whys.
- Proficient in data analysis techniques and skills, including a working knowledge of statistics and statistical process control.
- Proficient in speaking, reading, and writing in English. Ability to speak at an intermediate level in Japanese, Chinese, Korean, or Hebrew is a plus.
- Excellent written and verbal technical communication skills.
- Ability to travel up to 30% with occasional international travel.
- U.S. Citizenship or U.S. Permanent Resident status required.